The Institute of Advanced Non-Destructive and Non-Invasive Diagnostic Technologies (IANDIT) is pleased to announce the upcoming Non-Destructive Testing (NDT) conference at MIE.
The conference agenda will cover a diverse array of state-of-the-art NDT methodologies, challenges, and opportunities in the automation of non-destructive examination (NDE) and its use for AI and machine learning, as well as the NDT landscape in Canada, including the regulatory framework. It is an excellent opportunity for engineers, researchers, and professionals dedicated to advancing NDT to come together, discuss crucial topics within the field, and explore potential career pathways in NDT.
Don’t miss out on this invaluable opportunity to expand your knowledge and network with NDT professionals!
Speakers
Glenn Tubrett
CEO. Canadian Institute for Non-Destructive Evaluation (CINDE)
Presentation Title: Understanding the NDT landscape in Canada including the regulatory framework and drivers for the sector.
Dave Seto
Director Of Business Development, UTEX Scientific Instruments Inc.
Presentation Title: Robotic Systems and Automation of NDE in Aerospace Manufacturing (or: Challenges and opportunities in automation of NDE
and its use for AI and machine learning.)
Raymond Ten Grotenhuis
Senior Engineer/Scientist/Technical Officer, Ontario Power Generation
Presentation Title: Review of future industry needs for state-of-the-art NDT methods and technologies.
Ed Cabral
Senior Instructor, Canadian Institute for Non-Destructive Evaluation (CINDE)
Presentation Title: The next frontier: industry evolution through advanced non-destructive technologies
Future Hu
4th year student, Computer Science, UofT, and UTEX Scientific Instruments
Presentation Title: Automatic ROI detection and non-destructive ultrasonic imaging using Time-of-flight Diffraction (TOFD) signals.
Registration
Please fill out the form to update your availability and time preference on Friday, April 5th by March 19th.